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ESP (Extended Surface Photometry) is a package
of application programs developed to allow you to determine the photometric
properties of galaxies and other extended objects. It has applications that:
- Detect/identify flatfielding faults - SKEW
- Remove cosmic ray events - TOPPED
- Median filter images on a defined scale - FASTMED
- Determine whole image statistics including: median count, modal count,
kurtosis and skewness - HISTPEAK
- Determine the local background value on a number of different parts
of an image - LOBACK
- Perform galaxy profiling using intensity analysis - ELLPRO
- Perform galaxy profiling using contour analysis - ELLFOU
- Perform 2-D Gaussian profiling of sources - GAUFIT
- Generate pie slice cross-sections of sources - SECTOR
- Display graphs showing the profiling/cross-section results - GRAPHS
- Help detect faint diffuse objects in an image - SELFC/SELFCW/CORR
ESP processes images stored as NDFs, and therefore you can use it in
conjunction with other packages like;
KAPPA,
CCDPACK,
Figaro,
PHOTOM,
JCMTDR
and
PISA.
It allows you to define areas to exclude in the analysis
using keyword descriptions in text ARD files.
There is now an interface to ESP within
GAIA. This supports all the ESP applications except
GRAPHS and HISTPEAK: GRAPHS is purely concerned with the display of
ESP output, and all the non-graphical functionality of HISTPEAK is
provided by the support for HSUB.
The ESP web page is at
http://www.astro.gla.ac.uk/users/norman/star/esp/
Next: What's new in this release
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ESP --- Extended Surface Photometry
Starlink User Note 180
Norman Gray
Mark Taylor
Grant Privett
27 January 2000
E-mail:ussc@star.rl.ac.uk
Copyright © 2002 Council for the Central Laboratory of the Research Councils