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A number of the ESP application allows image regions to be defined as being of
poor quality by two basic methods; by use of an NDF whose data component
values are set bad (either explicitly or by use of the quality component
and the badbits flag -- see SUN/33) or by interpreting bad-region
commands contained within an ordinary text file (an ASCII Region Definition file
-- ARD file -- see SUN/183)
An NDF, with the appropriate pixels set to the bad value, can be produced
interactively using the KAPPA applications ARDGEN and ARDMASK
(SUN/95).
The capabilities of the ARD option (which uses little disk
and could form part of a `database' of data masking information)
are described below.
As things stand, with images generated using a known CCD, the bad or hot
pixels, rows or columns might be
defined by ARDGEN so that they are always set to bad and excluded from all
subsequent processing. The information required is often supplied by the
observatory operating the CCD and can placed in a text file using
any text editor.
Next: Detailed description of ARD files
Up: ESP Extended Surface Photometry
Previous: TOPPED-Remove all pixel values above a certain limit from an NDF image file
ESP --- Extended Surface Photometry
Starlink User Note 180
Norman Gray
Mark Taylor
Grant Privett
27 January 2000
E-mail:ussc@star.rl.ac.uk
Copyright © 2002 Council for the Central Laboratory of the Research Councils