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ESP (Extended Surface Photometry) is a package
of application programs developed to allow you to determine the photometric
properties of galaxies and other extended objects.
It has applications that:
detect flatfielding faults, remove cosmic rays, median filter images,
determine image statistics, determine local background values,
perform galaxy profiling, fit 2-D Gaussian profiles to galaxies,
generate pie slice cross-sections of galaxies and display
profiling results.
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Up: ESP Extended Surface Photometry
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ESP --- Extended Surface Photometry
Starlink User Note 180
Norman Gray
Mark Taylor
Grant Privett
27 January 2000
E-mail:ussc@star.rl.ac.uk
Copyright © 2002 Council for the Central Laboratory of the Research Councils